Jingyao Zhang1,2,3,4,5?, Tao He1,2,3,4,5?*, Chengfeng Li1,2,3,4,5, Chengfeng Lu1,2,3,4,5, Chengxing Lai1,2,3,4,5, Qinghua Song6, Zhanshan Wang1,2,3,4,5, Yuzhi Shi1,2,3,4,5*, Zeyong Wei1,2,3,4,5* and Xinbin Cheng1,2,3,4,5*
同濟(jì)大學(xué)程鑫彬教授、施宇智教授、魏澤勇副教授、何濤助理教授
1 Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
2 MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China.
3 Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China.
4 Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, Shanghai 200092, China.
5 Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China.
6 Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, China
? These authors contributed equally to this work.
